By Bharat Bhushan, Harald Fuchs
From the reviews:
"Vol. XI comprises contributions approximately contemporary advancements in scanning probe microscopy strategies. … The editors and their proficient authors were one of the leaders within the learn of probe equipment. … every one bankruptcy captures either the buzz and the significance of the paintings and conclusions suggested, and should make ecocnomic interpreting for researchers in any respect adventure degrees. … all of the chapters are supported by way of huge lists of references and fantastically illustrated and in colour too, additionally in addition to graphs, equations etc." (Current Engineering perform, 2009)
“The articles … are written in adequate aspect, in order that collage scholars, researchers and engineers can comprehend the physics of the tools, the layout and building of the units and the cantilevers, the sign processing algorithms, and their use in imaging and the skin characterization of the specimens. … SPM features a number of suggestions, together with scanning near-field optical microscopy, which has fascinating functions … . well-written and obviously illustrated. … include abundant experimental facts and important dialogue of barriers and artifacts.” (Barry R. Masters, Optics & Photonics information, September, 2009)
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Additional resources for Applied Scanning Probe Methods XI: Scanning Probe Microscopy Techniques
Sample text
1 Quantitative Measurement of Materials Properties with the (Digital) Pulsed Force Mode Alexander M. Gigler, Othmar Marti . . . . . . . . . 23 Advances in SPMs for Investigation and Modification of Solid-Supported Monolayers Bruno Pignataro . . . . . . . . . . . . . . 55 Atomic Force Microscopy Studies of the Mechanical Properties of Living Cells Félix Rico, Ewa P. Wojcikiewicz, Vincent T. Moy . . . . . 89 17 Towards a Nanoscale View of Microbial Surfaces Using the Atomic Force Microscope Claire Verbelen, Guillaume Andre, Xavier Haulot, Yann Gilbert, David Alsteens, Etienne Dague and Yves F.
347 Automated AFM as an Industrial Process Metrology Tool for Nanoelectronic Manufacturing Tianming Bao, David Fong, Sean Hand . . . . . . . . it. M. es XLVI List of Contributors – Volume XI Dmytro S. de Mykhaylo Evstigneev Fakult¨at f¨ur Physik, Universit¨at Bielefeld, Universit¨atsstr. De Harald Fuchs Physikalisches Institut and Center for Nanotechnology (CeNTech), Universit¨at M¨unster, Wilhelm-Klemm-Str. de Donna C. gov Johann Jersch Physikalisches Institut, Universit¨at M¨unster, Wilhelm-Klemm-Str.
The hysteresis is due to the thin water film on surfaces at ambient conditions. Fig. 7. 3 nm; (b) at atomic resolution 1 Oscillation Control in Dynamic SPM with Quartz Sensors 13 Fig. 8. Image of LB strips on a plasma-etched Si surface under ambient conditions and a signal versus distance curve Further, in Fig. 9 we present images obtained by use of developed circuits in the SNOM distance control. As a force sensor, the relatively big tetrahedral glass tip [35] attached on a 32-kHz tuning fork was used.