
By W. Richard Bowen
This is the 1st e-book to assemble either the fundamental thought and confirmed procedure engineering perform of AFM. it truly is awarded in a fashion that's available and precious to practicing engineers in addition to to those that are enhancing their AFM talents and data, and to researchers who're constructing new items and recommendations utilizing AFM.
The booklet takes a rigorous and sensible technique that guarantees it truly is at once appropriate to procedure engineering difficulties. basics and strategies are concisely defined, whereas particular advantages for strategy engineering are truly outlined and illustrated. Key content material comprises: particle-particle, and particle-bubble interactions; characterization of membrane surfaces; the advance of fouling resistant membranes; nanoscale pharmaceutical research; nanoengineering for mobile sensing; polymers on surfaces; micro and nanoscale rheometry.
- Atomic strength microscopy (AFM) is a vital instrument for technique engineers and scientists because it permits stronger techniques and products
- The basically ebook facing the speculation and useful purposes of atomic strength microscopy in approach engineering
- Provides best-practice assistance and event on utilizing AFM for technique and product improvement
Read Online or Download Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products PDF
Best instruments & measurement books
Materials Characterization: Introduction to Microscopic and Spectroscopic Methods
This ebook covers cutting-edge strategies customary in smooth fabrics characterization. vital points of characterization, fabrics constructions and chemical research, are incorporated. regular ideas, reminiscent of metallography (light microscopy), X-ray diffraction, transmission and scanning electron microscopy, are defined.
The big dish: The fascinating story of radio telescopes
Excellent FIRST version HARDCOVER WITH dirt JACKET COLLECTIBLE.
Laser-based measurements for time and frequency domain applications : a handbook
Foreword through Nobel laureate Professor Theodor W. Hänsch of Ludwig-Maximilians-Universität München according to the authors’ experimental paintings during the last 25 years, Laser-Based Measurements for Time and Frequency area functions: A instruction manual offers uncomplicated techniques, state of the art purposes, and destiny developments in optical, atomic, and molecular physics.
The traditional mathematical foundation of the Aramaic calendars within the lifeless Sea Scrolls is analysed during this research. Helen R. Jacobus re-examines an Aramaic zodiac calendar with a thunder divination textual content (4Q318) and the calendar from the Aramaic Astronomical ebook (4Q208 - 4Q209), all from Qumran. Jacobus demonstrates that 4Q318 is an ancestor of the Jewish calendar this day and that it is helping us to appreciate 4Q208 - 4Q209.
- Tracking Environmental Change Using Lake Sediments: Terrestrial, Algal, and Siliceous Indicators
- The Physics and Technology of Ion Sources, Second Edition
- Conversion Tables of Units in Science & Engineering
- Advanced scientific computing in BASIC with applications in chemistry, biology and pharmacology
Additional resources for Atomic Force Microscopy in Process Engineering. Introduction to AFM for Improved Processes and Products
Example text
H. K. A. Wendman, G. Gurley, V. Elings, Short cantilevers for atomic force microscopy, Rev. Sci. Instrum. 67 (10) (1996) 3583–3590. [108] A. Torii, M. Sasaki, K. Hane, S. Okuma, A method for determining the spring constant of cantilevers for atomic force microscopy, Meas. Sci. Technol. 7 (1996) 179–184. T. S. Watson, S. Myra, Determination of the spring constants of probes for force microscopy/spectroscopy, Nanotechnology 7 (1996) 259–262. M. Notley, S. J. Craig, Calibration of colloid probe cantilevers using the dynamic viscous response of a confined liquid, Rev.
89 (8) (1988) 5190–5192. M. M. McClellamd, R. Erlandsson, S. Chiang, Atomic-scale friction of a tungsten tip on a graphite surface, Phys. Rev. Lett. 59 (17) (1987) 1942–1946. [31] Y. Miyahara, T. Fujii, S. Watanabe, A. Tonoli, S. Carabelli, H. Yamada, H. Bleuler, Lead zirconate titanate cantilever for non-contact atomic force microscopy, Appl. Surf. Sci. 140 (1999) 428–431. H. Sorenson, U. W. A. Morch, Preparation of platinum/ iridium scanning probe microscopy tips, Rev. Sci. Instrum. 70 (7) (1999) 3059–3067.
Appl. Phys. 83 (9) (1998) 4672–4677. E. Peterson, Silicon as a mechanical material, Proc. IEEE 70 (5) (1982) 420–457. [23] A. Khan, J. Philip, P. Hess, Young’s modulus of silicon nitride used in scanning force microscope cantilevers, J. Appl. Phys. 95 (4) (2004) 1667–1672. J. A. Evans, Young’s modulus, shear modulus, and Poisson’s ratio in silicon and germanium, J. Appl. Phys. 36 (1) (1965) 153–156. [25] T. Hantschel, S. Slesazeck, P. Niedermann, P. Eyben, W. Vandervorst, Integrating diamond pyramids into metal cantilevers and using them as electrical AFM probes, Microelectron.